Local Characterization of Piezo-Responsive Materials

Author(s):

Kenneth E. Strawhecker and Latha Nataraj

Abstract:

This study created two methodologies for local piezoresponse measurements of piezo-responsive materials using an atomic force microscopy: single-frequency piezoresponse force microscopy (PFM) and dual-AC resonance tracking-PFM. The methodologies were created to determine whether they were capable of 1) detecting and quantifying a piezoresponse and 2) comparing the quantitative piezoresponse of different materials. Five different probes and two different materials were used in this study.